掲載日：
講演会
開催日：
| 日時 | 2024年5月31日(金) 14:00 – 15:00 |
|---|---|
| 会場 | 電子科学研究所（北20条西10丁目）1F セミナー室1-2 |
| 講師 | Bin Feng (フウビン)准教授（東大 総合研究機構） |
| 題目 | Grain boundary segregation in ceramics materials studied using STEM-EDS (STEM-EDSによるセラミックス材料の粒界偏析の研究) |
| 要旨 | Grain boundary (GB) segregation plays an important role in ceramic materials. The enrichment of dopant atoms at GBs strongly affects the microstructure and chemistry, and therefore, dominates the macroscopic properties of the polycrystalline ceramic materials. With the recent progress of aberration-corrected scanning transmission electron microscopy (STEM) and energy-dispersive x-ray spectroscopy (EDS), direct observation of atomistic GB segregation phenomena is possible for ceramic materials, which greatly improved the understanding towards GB segregation. In this study, we will show our recent studies on GB segregation in Al2O3, using atomic-resolution STEM-EDS. |
| 主催 | 電子科学研究所 学術交流委員会 |
| 共催 | 応用物理学会北海道支部 |
| 連絡先 | 太田裕道（薄膜機能材料研究分野） |
